NEW: TIDeX – Total Ionizing Dose Instrument

Ensure quality and assess radiation durability with TIDeX, a specialized inspection station using X-ray irradiation to evaluate semiconductor wafers, packaged integrated circuits (IC), and other electronics for Total Ionizing Dose (TID) effects.
By testing devices under controlled radiation exposure and calculating TID, engineers can accurately assess and enhance radiation hardness of components before integration, ensuring long-term reliability in demanding environments.

Key features:
Precise radiation hardness testing of wafers and packaged ICs
All-in-one X-ray, shutter and probe station
Fully integrated dosimetry
Adjustable 10x objective microscope
Probe card holder that enables custom collimators and probe cards